Allow me a post of self advertisment:
just to announce PATSTAT revisited, IDE Discussion Papers No.527,
http://www.ide.go.jp/English/Publish/Download/Dp/527.html
written by me and Byeongwoo Kang from IDE-JETRO.
This study provides a comprehensive summary of and guidance for using the EPO Worldwide Patent Statistical Database (PATSTAT), one of the most widely used patent databases for researchers. We highlight the three most important issues that PATSTAT users must consider when performing patent data analyses and suggest ways to deal with those issues. Although PATSTAT is chosen in this study, the issues that we discuss are also applicable to other patent databases.
Keywords: PATSTAT, patent data analysis, innovation studies
JEL classification: O39, Y20, Z00
just to announce PATSTAT revisited, IDE Discussion Papers No.527,
http://www.ide.go.jp/English/Publish/Download/Dp/527.html
written by me and Byeongwoo Kang from IDE-JETRO.
This study provides a comprehensive summary of and guidance for using the EPO Worldwide Patent Statistical Database (PATSTAT), one of the most widely used patent databases for researchers. We highlight the three most important issues that PATSTAT users must consider when performing patent data analyses and suggest ways to deal with those issues. Although PATSTAT is chosen in this study, the issues that we discuss are also applicable to other patent databases.
Keywords: PATSTAT, patent data analysis, innovation studies
JEL classification: O39, Y20, Z00
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